Journal title: Metrology

EISSN: 2673-8244
Keywords: cyberphysical systems, machine learning for metrology, metrology for sustainable manufacturing, measurement uncertainty in dynamic processes
Languages: English
Publisher: MDPI AG
Country: Switzerland
APC: Yes
Subjects: Science: Mathematics: Instruments and machines: Electronic computers. Computer science | Technology: Technology (General): Industrial engineering. Management engineering: Applied mathematics. Quantitative methods